About the Organisers

JAIN (Deemed-to-be University)—CMS B-School stands out as one of India’s top business schools with an international perspective. Celebrated for its excellence, our MBA programme seamlessly blends rigorous academic research with innovative solutions to tackle today’s global business challenges.

About the Event

JAIN (Deemed-to-be University) is thrilled to announce the Five-Day Online Faculty Development Programme titled Introduction to Econometrics and Time Series Analysis, which will be held between December 16 and 20, 2024, from 02:00 PM to 04:00 PM (IST). The programme aims to equip participants with a comprehensive understanding of key econometric principles, particularly those related to analysing time series data.

This dynamic event invites individuals from diverse disciplines to share their research and engage in thought-provoking discussions on Econometrics.

Key Highlights

• Distinguish between endogenous and exogenous variables and explore various economic data types.
• Select suitable time series models tailored to data characteristics and research goals.
• Gain proficiency in E-Views software for data analysis and visualisation techniques.
• Master advanced econometric concepts like stationarity tests, VECM, and VAR models through hands-on exercises.

Registration Details : Registration Link: Click Here.

*E-certificates will be provided to all the registered participants

Contact Details

Dr. Rajkumar Chavan

The Center for Management Studies (CMS) of JAIN (Deemed-to-be University), Bengaluru.

Dr. Shalini R

Associate Professor, The Center for Management Studies (CMS) of JAIN (Deemed-to-be University), Bengaluru. 

Dr. Pujari Sudharshana Reddy

Assistant Professor, Academician, The Center for Management Studies (CMS) of, JAIN (Deemed-to-be University), Bengaluru. 

Let’s work together to advance through thorough research, interdisciplinary collaboration, and innovative solutions. Together, we can devise strategies, explore the complexities of data sciences, and contribute to this dynamic field.